Scientific and Technical Journal


ISSN Print 2221-3937
ISSN Online 2221-3805

Purpose - to increase the effectiveness of the methods for generation checking tests of digital systems based on an evolutionary approach and models for non-const fault. The analysis of the current state of the problem of testing cross talk faults for digital circuits. There are presented existing approaches to solving this problem in Ukraine and abroad. Unresolved questions remain currently in design of multi-valued models for this type and test generation. The problem of simulation and test generation for cross-induced pulse in combinational digital devices is considered. Formalized statement of the problem of test generation for single cross fault - induced pulses and delays. It is shown that this problem is reduced to solving a system of logical equations in the multi-valued alphabet. A method of multi-valued logic simulation in the alphabet C9 is proposed, which allows you to simulate circuits with fault "induced impulses." The 9-valued alphabet and basic functions of valves in the alphabet are defined. It was developed method of modeling for cross talk faults in 9-valued alphabet. On this basis, we developed a genetic algorithm for generation of checking tests for single cross-faults. The efficiency of multi-valued logic simulation in conjunction with the evolutionary approach to the problem of test generation for faults of this type is shown.


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